Alexei Ioudovski

Alexei Ioudovski is an intellectual property consultant in the high-tech area. He provides technical support for licensing, technology and patent evaluation as well as reverse engineering.

Prior to establishing his IP consulting business in 2003, Alexei worked as a research fellow in the fields of Image Processing, Pattern Recognition and Remote Sensing of Environment from Space. He published several research papers on the computer simulation of imaging and video systems and co-authored a book, Remote Sensing of the Ocean, on statistical aspects of satellite data processing and interpretation. His industrial experience includes several positions in R&D departments as a developer, project leader and manager with Semiconductor Insights (Canada), Symagery Microsystems (Canada), PressTech Controls (UK), Impuls Computergestutzte Bildanalyse GmbH (Germany), Nobile Vision Robotics (Canada) and Annidis Health Systems (Canada).

Alexei offers his technical expertise and over 35 years of R&D experience to full cycle licensing campaigns from portfolio analysis and patent assessment, to infringement analysis and infringement report generation, at various levels from indication of use to the litigation level. Also, Alexei assists customers in need to perform technical due diligence by an independent consultancy, and OEM’s seeking to utilize or improve their products.

Alexei’s areas of expertise include image and video processing; imaging devices; image and video compression standards and practices; 2D and 3D graphics standards and implementation in hardware and software; consumer electronics, multimedia streaming standards, industry practices and systems; and software and firmware reverse engineering. Alexei successfully completed many reverse engineering projects that required development of test plans and functional tests of various complexities.

Alexei holds a master’s degree in Applied Optics with specialization in Electro-optical Systems from the Moscow University of Geodesy and Cartography, Faculty of Applied Optics.